The interlayer magnetic coupling between two ferromagnetic layers (FM) across an antiferromagnetic (AFM) or a nonmagnetic spacer layer, epitaxially grown on Cu(001), has been studied in this work. As FM layers were used Co, FeNi which show an in-plane EA magnetization direction and Ni with an out-of-plane EA magnetization direction in a certain thickness regime. As an AFM layer was chosen Fe50Mn50, and Cu as a nonmagnetic spacer layer. The layer-by-layer growth of Co, Ni, FeNi and Fe50Mn50 has been deduced from the presence of MEED/RHEED oscillations acquired during deposition. In particular for Fe50Mn50, the surface morphology has been studied by scanning tunnelling microscopy (STM). The magnetic properties have been measured by magneto-optic Kerr effect and by imaging magnetic domains, using a photoelectron emission microscope (PEEM) with X-ray magnetic circular dichroism (XMCD) as magnetic contrast mechanism.